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Testing system for microelectronic devices

Testing system for microelectronic devices

The new MicroImpact Testing System from Instron is designed for research and development (R&D) or process quality control of microelectronic devices manufactured for the electronics industry.

With the ability to achieve shear speed from .2 m/s to 1 m/s using a low-inertia load transducer, the system incorporates an LVDT to collect force and displacement data while minimizing noose from the machine response.

The MicroImpact system also comes complete with Impulse software and an instrumentation package for impact data and analysis.


Additional features include accurate energy consumption, comprehensive calculation capability for developing reports, six digital filter functions with user settable cutoff frequencies and filter order functions, and two high-magnifications for precise setup and failure inspection.

Instron Canada Inc. (Burlington, Ont.);; 800-461-9123

Accurate, repeatable leak testing

Cincinnati Test Systems recently introduced the new Sentinel I-24, designed to provide repeatable and accurate leak testing.

Advanced standard features include multi-test configurability for any test requirement; flexible communications formats of Ethernet, USB port or RS232; automatic part setup for easy programming of up to 99 part programs; and up to five programmable tool controls.

Auto calibration ensures accurate results and easy operation, while the instrument’s “Quik” test feature reduces time and analyzes test results in real time.

Data storage is expandable through USB port and offer part traceability, and the instrument can be either wall mounted or bench top mounted.

Cincinnati Test Systems Inc. (Cleves, Ohio);; 513-367-6699

Millennium Technical Services (Creemore, Ont.); 705-466-5223


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